| DC Field | Value | Language |
|---|
| dc.contributor.author | Shauchuk, A. G. | - |
| dc.contributor.author | Tsviatkou, V. Yu. | - |
| dc.date.accessioned | 2017-11-29T08:13:53Z | - |
| dc.date.available | 2017-11-29T08:13:53Z | - |
| dc.date.issued | 2016 | - |
| dc.identifier.citation | Shauchuk A. G. Method of normalization of the contour line in thickness based on binary masks / A. G. Shauchk, V. Yu. Tsviatkou // Sadeq International Conference on Multidisciplinary in IT and Communication Science and Applications (AIC-MITCSA) (IEEE Conference Publications), 9-10 May. – 2016. – 6 pp. | ru_RU |
| dc.identifier.uri | https://libeldoc.bsuir.by/handle/123456789/28134 | - |
| dc.description.abstract | We propose a method of normalization in thickness of the
contour lines based on the analysis by mask of the local orientations of
fragments. Comparison of the proposed method with known methods of
thinning is held. It is shown that the proposed method is superior to the
known methods of thinning on speed and quality. | ru_RU |
| dc.language.iso | en | ru_RU |
| dc.publisher | IEEE | ru_RU |
| dc.subject | публикации ученых | ru_RU |
| dc.subject | normalization of the contour lines in thickness | ru_RU |
| dc.subject | the mask analysis | ru_RU |
| dc.subject | thinning | ru_RU |
| dc.title | Method of normalization of the contour line in thickness based on binary masks | ru_RU |
| dc.type | Статья | ru_RU |
| Appears in Collections: | Публикации в зарубежных изданиях
|
