| DC Field | Value | Language |
|---|
| dc.date.accessioned | 2017-12-29T07:55:44Z | - |
| dc.date.available | 2017-12-29T07:55:44Z | - |
| dc.date.issued | 2017 | - |
| dc.identifier.citation | Wolkenstein, S. S. Lazer Photothermoacoustic Microscopy Verification / S. S. Wolkenstein, A. A. Khmyl // Приборостроение 2017: материалы 10-ой Международной научно-технической конференции (Минск, 1 – 3 октября 2017 г.). – Минск: БНТУ, 2017. – С. 354 – 355. | ru_RU |
| dc.identifier.uri | https://libeldoc.bsuir.by/handle/123456789/28939 | - |
| dc.description.abstract | New possibilities are opened towards original highly sensitive nondestructive testing method – laser photothermoacoustic microscopy (LPTAM), based on applied physical multigraded principles of faint signals excitation, registration and processing with posterior extraction of useful information concerning permanent coonecrions internal structure with macro-, micro- and sub micro- resolution. | ru_RU |
| dc.language.iso | en | ru_RU |
| dc.publisher | БНТУ | ru_RU |
| dc.subject | публикации ученых | ru_RU |
| dc.subject | laser photothermoacustic microscopy | ru_RU |
| dc.subject | LPTAM topogram | ru_RU |
| dc.subject | semiconductor device | ru_RU |
| dc.title | Lazer Photothermoacoustic Microscopy Verification | ru_RU |
| dc.type | Статья | ru_RU |
| Appears in Collections: | Публикации в изданиях Республики Беларусь
|
