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Please use this identifier to cite or link to this item: https://libeldoc.bsuir.by/handle/123456789/34310
Title: Spectroscopic ellipsometry study of Cu2ZnSnS4 bulk poly-crystals
Authors: Levchenko, S.
Hajdeu-Chicaros, E.
Llamas, E.
Caballero, R.
Serna, R.
Bodnar, I. V.
Victorov, I. A.
Guc, M.
Merino, H. M.
Perez-Rodrigez, A.
Arushanov, E.
Leyn, M.
Keywords: публикации ученых;Cu2ZnSnS4 bulk polycrystals;fundamental absorption edge;absorption coefficient;optoelectronic devices
Issue Date: 2018
Publisher: American Institute of Physics
Citation: Spectroscopic ellipsometry study of Cu2ZnSnS4 bulk poly-crystals / S. Levchenko [et al.] // Appl. Phys. Lett. – 2018. – V.112, № 16. – P. 161901. – DOI: https://doi.org/10.1063/1.5024683.
Abstract: The linear optical properties of Cu2ZnSnS4 bulk polycrystals have been investigated using spectroscopic ellipsometry in the range of 1.2–4.6 eV at room temperature. The characteristic features identified in the optical spectra are explained by using the Adachi analytical model for the interband transitions at the corresponding critical points in the Brillouin zone. The experimental data have been modeled over the entire spectral range taking into account the lowest E0 transition near the fundamental absorption edge and E1Aand E1B higher energy interband transitions. In addition, the spectral dependences of the refractive index, extinction coefficient, absorption coefficient, and normal-incidence reflectivity values have been accurately determined and are provided since they are essential data for the design of Cu2ZnSnS4 based optoelectronic devices.
URI: https://libeldoc.bsuir.by/handle/123456789/34310
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