https://libeldoc.bsuir.by/handle/123456789/36454| Title: | Reliability Prediction of Electroniс Devices, Considering the Gradual Failures |
| Authors: | Borovikov, S. M. Shneiderov, E. N. |
| Keywords: | публикации ученых;prediction;electronic devices;physical-statistical models;gradual failures;прогнозирование;электронные приборы;физико-статистические модели;постепенные отказы |
| Issue Date: | 2018 |
| Publisher: | Faculty of Management Science and Informatics |
| Citation: | Borovikov, S. M. Reliability Prediction of Electroniс Devices, Considering the Gradual Failures / Sergei M. Borovikov, Evgeni N. Shneiderov // Central European Researchers Journal. – 2018. – Vol.4. – Issue 2. – P. 41-47. |
| Abstract: | The authors suggest a method of the reliability prediction for electronic devices, considering possible gradual failures. Reliability prediction value of the new samples can be given using the degradation (ageing) parameters’ model obtained by preliminary research of a sample of products. |
| URI: | https://libeldoc.bsuir.by/handle/123456789/36454 |
| Appears in Collections: | Публикации в зарубежных изданиях |
| File | Description | Size | Format | |
|---|---|---|---|---|
| Borovikov_Reliability.pdf | 339.88 kB | Adobe PDF | View/Open |
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