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Please use this identifier to cite or link to this item: https://libeldoc.bsuir.by/handle/123456789/38538
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dc.contributor.authorVolcheck, V. S.-
dc.contributor.authorStempitsky, V. R.-
dc.date.accessioned2020-02-12T11:45:32Z-
dc.date.available2020-02-12T11:45:32Z-
dc.date.issued2019-
dc.identifier.citationVolcheck, V. S. Mobility of a two-dimensional electron gas in the AlGaN/GaN heterostructure: simulation and analysis / V. Volcheck, V. Stempitsky // Journal of Physics: Conference Series. – 2019. – № 1410. – P. 012200. – DOI: https://doi.org/10.1088/1742-6596/1410/1/012200.ru_RU
dc.identifier.urihttps://libeldoc.bsuir.by/handle/123456789/38538-
dc.description.abstractAt temperatures higher than the room temperature, a two-dimensional electron gas (2DEG) formed at the AlGaN/GaN heterointerface can be characterized by the three dominant scattering mechanisms: acoustic deformation potential, polar acoustic phonon and polar optical phonon scatterings. An analytical model describing the 2DEG mobility limited by these scattering mechanisms as a function of the carrier concentration and the temperature was developed and integrated into a device simulator package using a C language interpreter. The model should be useful for heterostructure device simulators such as Blaze.ru_RU
dc.language.isoenru_RU
dc.publisherIOP Publishingru_RU
dc.subjectпубликации ученыхru_RU
dc.subjectmobilityru_RU
dc.subjectheterostructureru_RU
dc.subjecttransistorru_RU
dc.subjectsimulationru_RU
dc.titleMobility of a two-dimensional electron gas in the AlGaN/GaN heterostructure: simulation and analysisru_RU
dc.typeСтатьяru_RU
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