| DC Field | Value | Language |
|---|
| dc.contributor.author | Petrovskaya, V. V. | - |
| dc.contributor.author | Demenkovets, D. V. | - |
| dc.date.accessioned | 2021-06-08T06:42:59Z | - |
| dc.date.available | 2021-06-08T06:42:59Z | - |
| dc.date.issued | 2021 | - |
| dc.identifier.citation | Petrovskaya, V. V. The basics of memory fault detection with march tests / V. V. Petrovskaya, D. V. Demenkovets // Проблемы экономики и информационных технологий : сборник тезисов и статей докладов 57-ой научной конференции аспирантов, магистрантов и студентов БГУИР, Минск, 19-21 апреля 2021 г. / Белорусский государственный университет информатики и радиоэлектроники. – Минск, 2021. – С. 329–330. | ru_RU |
| dc.identifier.uri | https://libeldoc.bsuir.by/handle/123456789/43940 | - |
| dc.description.abstract | The article focuses on detecting memory matrix faults. The trends in the evolution of storage devices are considered and the generalized memory model is provided. The classification of single-cell fault models and the dominant testing method are given. The article shows the advantages and disadvantages of march tests. | ru_RU |
| dc.language.iso | en | ru_RU |
| dc.publisher | БГУИР | ru_RU |
| dc.subject | материалы конференций | ru_RU |
| dc.subject | memory system testing | ru_RU |
| dc.subject | single-cell faults | ru_RU |
| dc.subject | march tests | ru_RU |
| dc.title | The basics of memory fault detection with march tests | ru_RU |
| dc.type | Статья | ru_RU |
| Appears in Collections: | Проблемы экономики и информационных технологий : материалы 57-й научной конференции аспирантов, магистрантов и студентов (2021)
|
