DC Field | Value | Language |
dc.contributor.author | Jongbin Kim, B. | - |
dc.contributor.author | Hoon-Ju Chung | - |
dc.contributor.author | Seung-Woo Lee | - |
dc.date.accessioned | 2021-12-23T08:16:02Z | - |
dc.date.available | 2021-12-23T08:16:02Z | - |
dc.date.issued | 2019 | - |
dc.identifier.citation | Jongbin Kim, B. Memory-in-pixel circuit with low temperature poly-Si and oxide TFTs / B. Jongbin Kim, Hoon-Ju Chung, Seung-Woo Lee // Eurodisplay 2019 : Book of abstracts of International Conference, Minsk, September 16-20, 2019 / Society for Information Display, Belarusian State University of Informatics and Radioelectronics ; ed.: V. A. Bogush [et al.]. – Minsk, 2019. – P. 84. | ru_RU |
dc.identifier.uri | https://libeldoc.bsuir.by/handle/123456789/46445 | - |
dc.description.abstract | Memory-in-pixel (MIP) circuit has been studied for years to reduce power consumption of display
products. Displays with MIP circuit can reduce power consumption because of their much lower frame rate
than that of conventional displays using memory characteristics. Meanwhile, commercial display products have begun to introduce display circuits using low temperature poly-silicon and oxide (LTPO) TFTs to improve the performance and to use an advantage of extremely low leakage current of oxide TFTs. In this paper, we propose a new MIP circuit to achieve low power consumption as well as high reliability using LTPO TFTs. | ru_RU |
dc.language.iso | en | ru_RU |
dc.publisher | БГУИР | ru_RU |
dc.subject | материалы конференций | ru_RU |
dc.subject | Memory-in-pixel | ru_RU |
dc.subject | display | ru_RU |
dc.subject | low temperature poly-silicon and oxide | ru_RU |
dc.title | Memory-in-pixel circuit with low temperature poly-Si and oxide TFTs | ru_RU |
dc.type | Статья | ru_RU |
Appears in Collections: | EuroDisplay 2019
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