DC Field | Value | Language |
dc.contributor.author | Bodnar, I. V. | - |
dc.contributor.author | Khoroshko, V. V. | - |
dc.contributor.author | Yashchuk, V. A. | - |
dc.contributor.author | Gremenok, V. F. | - |
dc.contributor.author | Mohsin Kazi | - |
dc.contributor.author | Khandaker, M. U. | - |
dc.contributor.author | Abid, A. G. | - |
dc.contributor.author | Zubar, T. I. | - |
dc.contributor.author | Tishkevich, D. I. | - |
dc.contributor.author | Trukhanov, A. V. | - |
dc.contributor.author | Trukhanov, S. V. | - |
dc.coverage.spatial | USA | en_US |
dc.date.accessioned | 2024-02-26T12:08:12Z | - |
dc.date.available | 2024-02-26T12:08:12Z | - |
dc.date.issued | 2023 | - |
dc.identifier.citation | Growing crystals and studying structure and electronic properties of Cu2ZnGe(SхSe1-x)4 compositions / I. V. Bodnar [et al.] // Heliyon. – 2023. – Vol. 9 , iss. 11. – P. 22533. | en_US |
dc.identifier.uri | https://libeldoc.bsuir.by/handle/123456789/54377 | - |
dc.description.abstract | Single crystals of Cu2ZnGeSe4 and Cu2ZnGeS4 solid solutions were developed and successfully obtained using the chemical vapor transfer method, with iodine acting as a transporter. The structure, compositional dependences of lattice parameters, pycnometric and X-ray densities and microhardness were determined. The chemical composition determined by the X-ray microanalysis satisfactorily corresponds to the nominal one with a tolerance of ±5 %. The XRD analysis showed that all the obtained compounds and their solid solutions have unit cell described by tetragonal symmetry. The attice parameters were found to be а = 5.342 ± 0.005 Å, с = 10.51 ± 0.01 Å for the Сu2ZnGeS4 compound and а = 5.607 ± 0.005 Å, с = 11.04 ± 0.01 Å for the Cu2ZnGeSe4, respectively. Structural studies confirmed the validity of the Vegard's law in relation to the obtained samples. The pycnometric densities of ∼4.28 g/cm3 for the Cu2ZnGeS4 and ∼5.46 g/cm3 for the Cu2ZnGeSe4 were found to be slightly less than their X-ray densities of ∼4.32 g/cm3 and ∼5.52 g/cm3, respectively. The maximum microhardness of ∼398 kg/mm2 for these solid solutions corresponds to x = 0.60. The melt point of the solid solutions increases from ∼1180 °C for the Сu2ZnGeSe4 up to ∼1400 °C for the Сu2ZnGeS4. Based on X-ray fluorescence analysis and DTA data, the phase diagram of the Cu2ZnGeSe4-Cu2ZnGeS4 system was constructed. Analysis of the obtained diagram indicates its first type according to Rozbom's classification. | en_US |
dc.language.iso | en | en_US |
dc.publisher | Cell Press | en_US |
dc.subject | публикации ученых | en_US |
dc.subject | single crystals | en_US |
dc.subject | chemical vapor transport method | en_US |
dc.subject | crystal structure | en_US |
dc.subject | microhardness | en_US |
dc.subject | state diagram | en_US |
dc.title | Growing crystals and studying structure and electronic properties of Cu2ZnGe(SхSe1-x)4 compositions | en_US |
dc.type | Article | en_US |
dc.identifier.DOI | https://doi.org/10.1016/j.heliyon.2023.e22533 | - |
Appears in Collections: | Публикации в зарубежных изданиях
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