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Please use this identifier to cite or link to this item: https://libeldoc.bsuir.by/handle/123456789/6762
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dc.contributor.authorBodnar, I. V.-
dc.contributor.authorTelesh, E. V.-
dc.contributor.authorGurieva, G.-
dc.contributor.authorSchorr, S.-
dc.date.accessioned2016-05-13T09:29:58Z-
dc.date.accessioned2017-07-27T12:26:52Z-
dc.date.available2016-05-13T09:29:58Z-
dc.date.available2017-07-27T12:26:52Z-
dc.date.issued2015-
dc.identifier.citationTransmittance spectra of Cu2ZnSnS4 thin films / I. V. Bodnar and others // Journal of Electronic Materials. – 2015. – Volume 44. – Issue 10. – Pp. 3283 – 3287.ru_RU
dc.identifier.urihttps://libeldoc.bsuir.by/handle/123456789/6762-
dc.description.abstractThin films of the quaternary compound semiconductor Cu2ZnSnS4 (CZTS) were produced by ion beam sputtering at substrate temperatures of 323 K, 423 K, and 573 K. The chemical and structural properties of the thin films were studied by electron microprobe analysis and grazing incidence x-ray diffraction. It was shown that, similarly to the corresponding crystals, the main phase in the thin films was Cu2ZnSnS4 with a tetragonal lattice and the space group l4Їl4Ї . The transmittance spectra near the fundamental absorption edge were used to establish the energies and nature of optical transitions. The energies of crystal-field splitting (Δcr) and spin–orbit splitting (Δso) of the valence band of the Cu2ZnSnS4 quaternary compound were calculated on the basis of the Hopfield quasi-cubic model.ru_RU
dc.language.isoenru_RU
dc.publisherJournal of Electronic Materialsru_RU
dc.subjectпубликации ученыхru_RU
dc.subjectCu2ZnSnS4ru_RU
dc.subjecttransmittance spectraru_RU
dc.subjectthin filmsru_RU
dc.titleTransmittance spectra of Cu2ZnSnS4 thin filmsru_RU
dc.typeArticleru_RU
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