https://libeldoc.bsuir.by/handle/123456789/43940| Title: | The basics of memory fault detection with march tests |
| Authors: | Petrovskaya, V. V. Demenkovets, D. V. |
| Keywords: | материалы конференций;memory system testing;single-cell faults;march tests |
| Issue Date: | 2021 |
| Publisher: | БГУИР |
| Citation: | Petrovskaya, V. V. The basics of memory fault detection with march tests / V. V. Petrovskaya, D. V. Demenkovets // Проблемы экономики и информационных технологий : сборник тезисов и статей докладов 57-ой научной конференции аспирантов, магистрантов и студентов БГУИР, Минск, 19-21 апреля 2021 г. / Белорусский государственный университет информатики и радиоэлектроники. – Минск, 2021. – С. 329–330. |
| Abstract: | The article focuses on detecting memory matrix faults. The trends in the evolution of storage devices are considered and the generalized memory model is provided. The classification of single-cell fault models and the dominant testing method are given. The article shows the advantages and disadvantages of march tests. |
| URI: | https://libeldoc.bsuir.by/handle/123456789/43940 |
| Appears in Collections: | Проблемы экономики и информационных технологий : материалы 57-й научной конференции аспирантов, магистрантов и студентов (2021) |
| File | Description | Size | Format | |
|---|---|---|---|---|
| Petrovskaya_The.pdf | 106.19 kB | Adobe PDF | View/Open |
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